Mechanisms of Ni Diffusion at Silicon Surface

Physics of Low-Dimensional Structures

Volumn 1999, Issue 11-12, 1999, Pages 41-52

  Dolbak, A E ^a   Olshanetsky, B Z ^a   Teys, S A ^a  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Russian Federation)

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EID: 0348229326     PISSN: 02043467     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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