Effects of BaBi2Ta2O9 thin buffer layer on crystallization and electrical properties of CaBi2Ta2O9 thin films on Pt-coated silicon

Journal of Applied Physics

Volumn 89, Issue 9, 2001, Pages 5088-5092

  Kato, Kazumi ^a,b   Suzuki, Kazuyuki ^b   Nishizawa, Kaori ^b   Miki, Takeshi ^b  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0347772034     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1361242     Document Type: Article

References (11)

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