Effects of Radiation Damage on Scientific Charge Coupled Devices

Advances in Imaging and Electron Physics

Volumn 106, Issue C, 1999, Pages 1-96

  Hardy, T D ^a,b   Deen, M J ^a   Murowinski, R ^b  

^a SIMON FRASER UNIVERSITY   (Canada)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0347729676     PISSN: 10765670     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S1076-5670(08)70269-6     Document Type: Article

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