Mass-resolved ion scattering spectrometry for characterization of samples with historical value

Applied Surface Science

Volumn 222, Issue 1-4, 2004, Pages 166-170

  Daolio, S ^a   Pagura, C ^a   Tolstogouzov, A ^a  

^a Istituto CNRper l'Energetica e le Interfasi   (Italy)

Author keywords

Archaeometry; Depth profiling; Low energy ion scattering; Quantification; Standard materials

Indexed keywords

CALIBRATION; ENVIRONMENTAL IMPACT; IMPURITIES; ION BEAMS; ION BOMBARDMENT; MASS SPECTROMETRY; PROBABILITY; SCATTERING; SIGNAL GENERATORS; SILVER; SPUTTERING; SURFACE CHEMISTRY; SURFACE STRUCTURE;

ARCHAEOMETRY; DEPTH PROFILING; LOW ENERGY ION SCATTERING;

COINAGE;

EID: 0347380879     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2003.08.005     Document Type: Article

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