메뉴 건너뛰기




Volumn 531, Issue 2, 2003, Pages 95-102

Dependence of scattered ion yield on the incident energy: Ne+ on pure gallium and indium

Author keywords

Gallium; Indium; Ion solid interactions; Low energy ion scattering (LEIS); Noble gases

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; GALLIUM; INDIUM; IONS; ISOTOPES; MASS SPECTROMETRY; PROBABILITY;

EID: 0038558141     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00532-6     Document Type: Article
Times cited : (8)

References (46)
  • 3
    • 0004012736 scopus 로고
    • Low energy ion-surface interactions
    • J.W. Rabalais (Ed.) Chichester: Wiley
    • Low energy ion-surface interactions Rabalais J.W. Wiley Series in Ion Chemistry and Physics. 1994;Wiley, Chichester.
    • (1994) Wiley Series in Ion Chemistry and Physics
  • 5
    • 0003680309 scopus 로고
    • N.H. Tolk, J.C. Tully, W. Heiland, & C.W. White. New York: Academic Press
    • Rusch T.W., Erickson R.L. Tolk N.H., Tully J.C., Heiland W., White C.W. Inelastic Ion-Surface Collisions. 1977;Academic Press, New York. p. 73.
    • (1977) Inelastic Ion-Surface Collisions , pp. 73
    • Rusch, T.W.1    Erickson, R.L.2
  • 16
    • 0037871125 scopus 로고    scopus 로고
    • Hiden Analytical Ltd, 420 Europe Boulevard, Warrington WA5 7UN, England
    • Hiden Analytical Ltd, 420 Europe Boulevard, Warrington WA5 7UN, England.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.