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Volumn 131, Issue 2, 2000, Pages 126-134
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Local average intensity-based method for identifying spherical particles in electron micrographs
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Author keywords
Automated object detection; Cryoelectron microscopy; Image processing; Pattern matching software; Spherical viruses
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Indexed keywords
ARTICLE;
COMPUTER AIDED DESIGN;
COMPUTER PROGRAM;
CRYOELECTRON MICROSCOPY;
IMAGE ANALYSIS;
IMAGE RECONSTRUCTION;
PRIORITY JOURNAL;
RELIABILITY;
VIRUS CHARACTERIZATION;
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EID: 0033787642
PISSN: 10478477
EISSN: None
Source Type: Journal
DOI: 10.1006/jsbi.2000.4279 Document Type: Article |
Times cited : (89)
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References (23)
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