Review: Automatic particle detection in electron microscopy

Journal of Structural Biology

Volumn 133, Issue 2-3, 2001, Pages 90-101

  Nicholson, William V ^a   Glaeser, Robert M ^a,b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Electron microscopy; Image processing; Object detection; Pattern recognition; Single particle reconstruction

Indexed keywords

ARTIFICIAL NEURAL NETWORK; CALCULATION; COMPUTER PROGRAM; CONFERENCE PAPER; CORRELATION ANALYSIS; CRYOELECTRON MICROSCOPY; DENSITY; PARTICLE SIZE; PRIORITY JOURNAL;

EID: 0035783159     PISSN: 10478477     EISSN: None     Source Type: Journal    
DOI: 10.1006/jsbi.2001.4348     Document Type: Conference Paper

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