Elastic constants investigation by X-ray diffraction of in situ deformed metallic multi-layers

Scripta Materialia

Volumn 50, Issue 6, 2004, Pages 723-727

  Goudeau, P ^a   Villain, P ^a   Girardeau, T ^a   Renault, P O ^a   Badawi, K F ^a  

^a UMR 6630   (France)

Author keywords

Elastic constants; Microstructure; Size effect; Tensile testing; X ray diffraction

Indexed keywords

ELASTIC MODULI; GRAIN BOUNDARIES; INTERFACES (MATERIALS); MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; PLASTIC DEFORMATION; PLASTICITY; POLYCRYSTALLINE MATERIALS; SOLUBILITY; SYNCHROTRONS; TENSILE TESTING; TEXTURES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

ELASTIC CONSTANTS; ELASTIC PROPERTIES; SIZE EFFECTS;

MULTILAYERS;

EID: 0347129653     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2003.11.053     Document Type: Article

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