Current conduction mechanism of Pt/GaN and Pt/Al0.35Ga 0.65N Schottky diodes

Journal of Applied Physics

Volumn 94, Issue 11, 2003, Pages 7201-7205

  Kim, Jong Kyu ^a   Jang, Ho Won ^a   Lee, Jong Lam ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; CARRIER CONCENTRATION; CHEMICAL BONDS; CONCENTRATION (PROCESS); CURRENT VOLTAGE CHARACTERISTICS; GALLIUM NITRIDE; HALL EFFECT; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PHOTOEMISSION; PLATINUM; POSITIVE IONS; SEMICONDUCTING ALUMINUM COMPOUNDS; SPECTROSCOPIC ANALYSIS; SYNCHROTRON RADIATION; ULTRAVIOLET DETECTORS; X RAY DIFFRACTION ANALYSIS;

CHEMICAL BONDING STATES; MOLE FRACTION; VALANCE-BAND SPECTRA;

SCHOTTKY BARRIER DIODES;

EID: 0346962327     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1625101     Document Type: Article

References (14)

1. V. Kumar, W. Lu, F. A. Khan, R. Schwindt, A. Kuliev, G. Simin, J. Yang, M. Asif Khan, and I. Adesida, Electron. Lett. 38, 252 (2002).
2. J. C. Carrano, T. Li, P. A. Grudowski, C. J. Eiting, R. D. Dupuis, and J. C. Campbell, J. Appl. Phys. 83, 6148 (1998).
3. S. L. Rumyantsev, N. Pala, M. Shur, R. Gaska, M. E. Levinshtein, V. Adivarahan, J. Yang, G. Simin, and M. Asif Khan, Appl. Phys. Lett. 79, 866 (2001).
4. D. Qiao, L. S. Yu, S. S. Lau, J. M. Redwing, J. Y. Lin, and H. X. Jiang, J. Appl. Phys. 87, 801 (2000).
5. L. S. Yu, D. J. Qiao, Q. J. Xing, S. S. Lau, K. S. Boutros, and J. M. Redwing, Appl. Phys. Lett. 73, 238 (2001).
6. L. Zhou, F. A. Khan, G. Cueva, V. Kumar, I. Adesida, M. R. Sardela, Jr., and F. D. Auret, Appl. Phys. Lett. 81, 1624 (2002).
7. S. L. Rumyantsev, N. Pala, M. Shur, R. Gaska, M. E. Levinshtein, V. Adivarahan, J. Yang, G. Simin, and M. Asif Khan, Appl. Phys. Lett. 79, 866 (2001).
8. P. Boguslawski, E. L. Briggs, and J. Bernholc, Phys. Rev. B 51, 17255 (1995).
9. C. Stampfl, J. Neugebauer, and C. G. Van de Walle, Mater. Sci. Eng., B 59, 253 (1999).
10. T. F. Kuech, D. J. Wolford, E. Veuhoff, V. Deline, P. M. Mooney, R. Potemski, and J. Bradley, J. Appl. Phys. 62, 632 (1987).
11. K. Kim, W. R. L. Lambrecht, B. Segall, and M. V. Schilfgaarde, Phys. Rev. B 56, 7363 (1997).
12. J. F. Moulder, W. F. Stickle, P. E. Sobol, and K. D. Bomben, Handbook of X-ray Photoelectron Spectroscopy (Perkin-Elmer Corp. Eden Prairie, MN, 1992).
13. J. P. Ibbetson, P. T. Fini, K. D. Ness, S. P. Denbaas, J. S. Speck, and U. K. Mishra, Appl. Phys. Lett. 77, 250 (2000).
14. J. Neugebauer and C. G. Van de Walle, Appl. Phys. Lett. 69, 503 (1996).