Thermal waves physics

Journal of Optoelectronics and Advanced Materials

Volumn 3, Issue 4, 2001, Pages 779-816

  Li Voti, R ^a   Liakhou, G L ^b   Paoloni, S ^a   Sibilia, C ^a   Bertolotti, M ^a  

^a SAPIENZA UNIVERSITY OF ROME   (Italy)

^b TECHNICAL UNIVERSITY OF MOLDOVA   (Moldova)

Author keywords

Hardness depth profiling; Photothermal techniques; Thermal diffusivity; Thermal waves; Thickness measurements

Indexed keywords

NONDESTRUCTIVE EXAMINATION; THERMAL DIFFUSIVITY; THICKNESS MEASUREMENT;

BASIC THEORY; HARDNESS DEPTH; NONDESTRUCTIVE TESTING OF MATERIALS; PHOTO-THERMAL TECHNIQUES; THERMAL WAVE;

DEPTH PROFILING;

EID: 0346448034     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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