Depth profiling of thermally inhomogeneous materials by neural network recognition of photothermal time domain data

Journal of Applied Physics

Volumn 85, Issue 10, 1999, Pages 7059-7063

  Glorieux, C ^a   Li Voti, R ^b   Thoen, J ^a   Bertolotti, M ^b   Sibilia, C ^b  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b SAPIENZA UNIVERSITY OF ROME   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0037613136     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370512     Document Type: Article

References (17)

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