Quantitative characterization of material inhomogeneities by thermal waves

Optical Engineering

Volumn 36, Issue 2, 1997, Pages 376-390

  Seidel, Uwe ^a,c,d   Lan, Ton Thi Ngoc ^a,e   Walther, Heinz Günter ^a,f   Schmitz, Bernhard ^b,g,h,i,j   Geerkens, Jürgen ^b,j   Goch, Gert ^b,k,l,m  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^b UNIVERSITY OF ULM   (Germany)

^c YORK UNIVERSITY   (Canada)

^d German Academic Exchange Service   (Germany)

^e INSTITUTE OF PHYSICS   (Viet Nam)

^f Inst of Opt and Quant Electronics   (Germany)

^g SAARLAND UNIVERSITY   (Germany)

^h HEBREW UNIVERSITY OF JERUSALEM   (Israel)

ⁱ Phototherm Dr Petry Company

^j UNIVERSITY OF ULM MEDICAL SCHOOL   (Germany)

^k TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

^l Hebrew University of Jerusalem ^*

^m LEIBNIZ UNIVERSITY HANNOVER   (Germany)

more..

Author keywords

Defect identification; Nondestructive evaluation; Photoacoustic and photothermal science and engineering; Photothermal imaging; Photothermal microscopy; Thermal properties; Thermal waves

Indexed keywords

EID: 0038627315     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.601235     Document Type: Article

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