Thickness measurement by photothermal deflection method: Basic influence of surface conductance

Progress in Natural Science

Volumn 6, Issue SPEC. ISS., 1996, Pages

  Paoloni, S ^a  

^a SAPIENZA UNIVERSITY OF ROME   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRY;

CONVECTIVE HEAT; FREQUENCY REGIMES; MODULATION FREQUENCIES; PHOTO-THERMAL DEFLECTION TECHNIQUE; PHOTOTHERMAL DEFLECTIONS; RADIATIVE HEAT; SOLID SAMPLES; SURFACE CONDUCTANCE; THERMAL WAVE INTERFEROMETRY;

THICKNESS MEASUREMENT;

EID: 20544470083     PISSN: 10020071     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (3)

1. C.A. Bennet, R.R. Patty -Applied Optics 21 (1), pp. 49 - 54 (1982).
2. A.C. Bento, D.P. Almond -Mat. Sci. Technol. 6, pp. 1022 - 1027 (1995).
3. T.T.N. Lan, U. Seidel, H.G. Walther -J. Appl. Phys. 77 (9), pp. 4739 - 4745 (1995).