Surface analyses of In-V oxide films aged electrochemically by Li insertion reactions

Physical Chemistry Chemical Physics

Volumn 5, Issue 24, 2003, Pages 5489-5498

  Coluzza, C ^a   Cimino, N ^b   Decker, F ^b   Di Santo, G ^a   Liberatore, M ^b   Zanoni, R ^b   Bertolo, M ^c   La Rosa, S ^c  

^a UNIVERSITÀ DI ROMA LA SAPIENZA   (Italy)

^b SAPIENZA UNIVERSITY OF ROME   (Italy)

^c SINCROTRONE TRIESTE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

GLASS; INDIUM; LITHIUM; LITHIUM CARBONATE; OXIDE; VANADIUM;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL COMPOSITION; CHEMICAL REACTION; CHEMICAL STRUCTURE; CYCLIC POTENTIOMETRY; ELECTRIC CONDUCTIVITY; ELECTROCHEMICAL ANALYSIS; ELECTRODE; FILM; IMPEDANCE; MICROSCOPY; REDUCTION; SCANNING ELECTRON MICROSCOPY; SCANNING PHOTOELECTRON SPECTROMICROSCOPY; SPECTROSCOPY; SURFACE PROPERTY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0346308384     PISSN: 14639076     EISSN: None     Source Type: Journal    
DOI: 10.1039/b306800e     Document Type: Article

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