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Volumn 54, Issue 1-4, 1999, Pages 245-249
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AFM and optical investigations of SERS-active silver electrodes
a b |
Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELECTROCHEMICAL ELECTRODES;
LIGHT REFLECTION;
OPTICAL VARIABLES MEASUREMENT;
RAMAN SCATTERING;
SURFACE ROUGHNESS;
SURFACES;
ELECTROCHEMICAL PROCESS;
SURFACE ENHANCED RAMAN SCATTERING;
SILVER;
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EID: 0033154326
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0042-207X(98)00472-2 Document Type: Article |
Times cited : (13)
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References (19)
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