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Volumn 54, Issue 1-4, 1999, Pages 245-249

AFM and optical investigations of SERS-active silver electrodes

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROCHEMICAL ELECTRODES; LIGHT REFLECTION; OPTICAL VARIABLES MEASUREMENT; RAMAN SCATTERING; SURFACE ROUGHNESS; SURFACES;

EID: 0033154326     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0042-207X(98)00472-2     Document Type: Article
Times cited : (13)

References (19)
  • 18
    • 0345575286 scopus 로고    scopus 로고
    • In Clark RJH, Hester RE. editors. Chichester, New York: Wiley
    • Cotton TM. In: Clark RJH, Hester RE. editors. Spectroscpy of Surfaces. Chichester, New York: Wiley, 1998:91.
    • (1998) Spectroscpy of Surfaces , pp. 91
    • Cotton, T.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.