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Volumn 58, Issue 1, 1999, Pages 118-125

Vibrational spectroscopy of defect complexes containing Au and H in Si

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; ELECTRIC CHARGE; GOLD; HYDROGEN; MOLECULAR VIBRATIONS;

EID: 0345504133     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(98)00295-5     Document Type: Article
Times cited : (23)

References (38)
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    • S.J. Pearton, in: J.I. Pankove, N.M. Johnson (Eds.), Hydrogen in semiconductors, Academic, Boston, 1991, p. 65.
    • (1991) Hydrogen in Semiconductors , pp. 65
    • Pearton, S.J.1
  • 30
    • 33847506356 scopus 로고
    • O. Madelung, M. Schulz (Eds.), Landolt-Börnstein, New Series, Group III, Pt. b, Springer, Germany
    • O. Madelung, M. Schulz (Eds.), Impurities and defects in group IV elements and III-V compounds, Landolt-Börnstein, New Series, Group III, Vol. 22, Pt. b, Springer, Germany, 1989, p. 224.
    • (1989) Impurities and Defects in Group IV Elements and III-V Compounds , vol.22 , pp. 224
  • 31
    • 77956934208 scopus 로고
    • F. Seitz, D. Turnbull (Eds.), Academic Press, NY
    • G.W. Ludwig, H.H. Woodbury, in: F. Seitz, D. Turnbull (Eds.), Solid state physics, vol. 13, Academic Press, NY, 1962, p. 223.
    • (1962) Solid State Physics , vol.13 , pp. 223
    • Ludwig, G.W.1    Woodbury, H.H.2
  • 35
    • 77956730156 scopus 로고    scopus 로고
    • R.K. Willardson, E.R. Weber (Eds.), Academic, Boston
    • M. Stavola, in: R.K. Willardson, E.R. Weber (Eds.), Semiconductors and semimetals, vol. 51B, Academic, Boston, 1998, p. 153.
    • (1998) Semiconductors and Semimetals , vol.51 B , pp. 153
    • Stavola, M.1
  • 36
    • 85031616728 scopus 로고    scopus 로고
    • note
    • The correspondence between the DLTS and infrared absorption data should be considered with caution. The infrared measurements are sensitive to the bulk of the sample whereas the DLTS measurements probe the depletion region of a Schottky barrier diode where hydrogen was probably also introduced by the etching treatment used to fabricate the diode.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.