SCOPUS 정보 검색 플랫폼

Volumn 35, Issue 11, 2003, Pages 932-939

Error surface calculations on the parameters defining oxygen depth profile models fitted to ARXPS data obtained from polystyrene exposed to an oxygen/helium plasma

(1) Paynter, R W a

a INRS EMT (Canada)

Author keywords

ARXPS; Depth profile; Plasma polymer

Indexed keywords

CALCULATIONS; GLASS; HELIUM; OXYGEN; PLASMAS; POLYSTYRENES; SOLUTIONS; TOLUENE; VACUUM; X RAY PHOTOELECTRON SPECTROSCOPY;

ANGLE RESOLVED X RAY PHOTOELECTRON SPECTROSCOPY; CONCENTRATION DEPTH PROFILES; ERROR SURFACES; OXYGEN DEPTH PROFILE;

SURFACES;

EID: 0345411888 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1629 Document Type: Article

Times cited : (6)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.