Growth and Characterization of High Quality Continuous GaN Films on Si-Doped Cracked GaN Templates

Physica Status Solidi (A) Applied Research

Volumn 188, Issue 1, 2001, Pages 421-424

  Chua, S J ^a   Hao, M ^a   Zhang, J ^b   Sia, E K ^b  

^a INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0344166944     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200111)188:1<421::AID-PSSA421>3.0.CO;2-4     Document Type: Article

References (11)

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