CdS nanocrystals entrapped in thin SiO2 films

Journal of Physical Chemistry B

Volumn 102, Issue 21, 1998, Pages 4081-4088

  Pham, M T ^a   Moller D ^a   Matz, W ^a   Mucklich A ^a   Oswald, S ^b  

^a INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^b IFW DRESDEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0344131008     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp973064d     Document Type: Article

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