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Volumn 81, Issue 4, 1997, Pages 1978-1984

An x-ray photoelectron spectroscopy investigation of O impurity chemistry in CdS thin films grown by chemical bath deposition

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001562761     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.364054     Document Type: Article
Times cited : (58)

References (24)
  • 10
    • 85033189935 scopus 로고
    • Polycrystalline Semiconductors IV-Physics, Chemistry and Technology, edited by S. Pizzini, H. P. Strunk, and J. H. Werner, Trans. Tech. Publ., Zug, Switzerland
    • A. Kylner, A. Rockett, and L. Stolt, in Polycrystalline Semiconductors IV-Physics, Chemistry and Technology, edited by S. Pizzini, H. P. Strunk, and J. H. Werner, in Solid State Phenomena (Trans. Tech. Publ., Zug, Switzerland, 1995).
    • (1995) Solid State Phenomena
    • Kylner, A.1    Rockett, A.2    Stolt, L.3
  • 16
    • 85033165557 scopus 로고    scopus 로고
    • Sputtering artifacts are described in more detail in Ref. 13
    • Sputtering artifacts are described in more detail in Ref. 13.
  • 17
    • 85033161527 scopus 로고    scopus 로고
    • note
    • 2O. Nevertheless, it made suitable reference for the identification of Cd-O bonds.
  • 24
    • 85033160864 scopus 로고    scopus 로고
    • note
    • The surface region has ∼3.8 a/o O, but only about one-third of that is involved in Cd-O bonds. See Fig. 5.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.