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Volumn 86, Issue 5, 2001, Pages 838-841

Is ion sputtering always a `negative homoepitaxial deposition'?

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; EPITAXIAL GROWTH; MORPHOLOGY; POINT DEFECTS; SCANNING TUNNELING MICROSCOPY; SPUTTER DEPOSITION; THERMAL EFFECTS;

EID: 0343408159     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.86.838     Document Type: Article
Times cited : (74)

References (27)
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    • note
    • tot.
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  • 27
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    • note
    • For the case of Ge(001) in [11], sputtering produces almost only surface point defects because of the low atomic density of the substrate [7].


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.