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Volumn 59, Issue 16, 1999, Pages 11014-11019

Monovacancy diffusion on ag(100), cu(100), and ni(100): prefactors and activation barriers

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001099246     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.11014     Document Type: Article
Times cited : (18)

References (25)
  • 20
    • 0001100863 scopus 로고
    • R. W. Siegel, J. R. Weertman, and R. Sinclair, Materials Research Society, and, in, edited by, 82 (, Pittsburgh, p
    • A. F. Voter and S P. Chen, in Characterization of Defects in Materials, edited by R. W. Siegel, J. R. Weertman, and R. Sinclair, MRS Symposia Proceedings No. 82 (Materials Research Society, Pittsburgh, 1986), p. 175.
    • (1986) MRS Symposia Proceedings , pp. 175
    • Voter, A.F.1    Chen, S.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.