Dielectric Bragg mirrors for InGaN surface-emitting lasers

Physica Status Solidi (A) Applied Research

Volumn 176, Issue 1, 1999, Pages 67-71

  Martin, R W ^a   Taek, Kim ^a   Burns, D ^a   Watson, I M ^a   Dawson, M D ^a   Krauss, T F ^b   Marsh, J H ^b   De La Rue, R M ^b   Romani, S ^c   Kheyrandish, H ^c  

^a UNIVERSITY OF STRATHCLYDE   (United Kingdom)

^b UNIVERSITY OF GLASGOW   (United Kingdom)

^c MATS UK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL MICROSTRUCTURE; ELECTRON MICROSCOPY; EPITAXIAL GROWTH; MASS SPECTROMETRY; MIRRORS; NITRIDES; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SILICA; X RAY CRYSTALLOGRAPHY; ZIRCONIA;

BRAGG MIRRORS;

SEMICONDUCTOR LASERS;

EID: 0342936466     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(199911)176:1<67::AID-PSSA67>3.0.CO;2-L     Document Type: Article

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