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Volumn 73, Issue 11, 1998, Pages 1571-1573
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Surface, stress, and impurity effects on room-temperature migration of ion-beam-generated point defects
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0342840006
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.122207 Document Type: Article |
Times cited : (3)
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References (15)
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