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Volumn 73, Issue 11, 1998, Pages 1571-1573

Surface, stress, and impurity effects on room-temperature migration of ion-beam-generated point defects

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0342840006     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122207     Document Type: Article
Times cited : (3)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.