Evidence of Si presence in self-assembled Ge islands deposited on a Si(001) substrate

Applied Physics Letters

Volumn 73, Issue 8, 1998, Pages 1044-1046

  Magidson, V ^a   Regelman, D V ^a   Beserman, R ^a   Dettmer, K ^b  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000031208     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122079     Document Type: Article

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