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Volumn 83, Issue 15, 2003, Pages 3162-3164

Pattern-induced alignment of silicon islands on buried oxide layer of silicon-on-insulator structure

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ELECTRON BEAM LITHOGRAPHY; OXIDATION; SEMICONDUCTING SILICON; SILICA;

EID: 0242367475     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1617370     Document Type: Article
Times cited : (35)

References (18)
  • 14
    • 0242278051 scopus 로고    scopus 로고
    • Unpublished data
    • (Unpublished data).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.