Spectroscopic ellipsometric study of Zn 1-xMn xTe films grown on GaAs

Journal of the Korean Physical Society

Volumn 31, Issue 1, 1997, Pages 202-205

  Choi, S G ^a   Kim, Y D ^a   Klein, M V ^b   Yoo, S D ^c   Aspnes, D E ^c   Xin, S H ^d   Furdyna, J K ^d  

^a Kyung Hee University   (South Korea)

^b University of Illinois at Urbana Champaign   (United States)

^c NORTH CAROLINA STATE UNIVERSITY   (United States)

^d UNIVERSITY OF NOTRE DAME   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 18744376975     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (5)

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2. S. P. McAlister, J. K. Furdyna and W. Giriat, Phys. Rev. B29, 1310 (1984).
3. D. L. Peterson, D. U. Bartholomew, U. Debska, A. K. Ramdas and S. Rodriguez, Phys. Rev. B32, 323 (1985).
4. A. Twardowski, T. Dietl and M. Demianiuk, Solid State Commun. 48, 845 (1983).
5. Y. R. Lee, A. K. Ramdas and R. L. Aggarwal, Phys. Rev. B33, 7383 (1986).