Structural characterization of CeO2-MO2 (M = Si4+, Ti4+, and Zr4+) mixed oxides by Raman spectroscopy, x-ray photoelectron spectroscopy, and other techniques

Journal of Physical Chemistry B

Volumn 107, Issue 41, 2003, Pages 11475-11484

  Reddy, Benjaram M ^a   Khan, Ataullah ^a   Yamada, Yusuke ^b   Kobayashi, Tetsuhiko ^b   Loridant, Stéphane ^c   Volta, Jean Claude ^c  

^a INDIAN INSTITUTE OF CHEMICAL TECHNOLOGY   (India)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^c INST DE RECHERCHES SUR LA CATALYSE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CALCINATION; CRYSTAL LATTICES; MICROSTRUCTURE; OXIDES; PRECIPITATION (CHEMICAL); RAMAN SPECTROSCOPY; STRUCTURE (COMPOSITION); SYNTHESIS (CHEMICAL); TEMPERATURE; THERMAL EXPANSION; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

COPRECIPITATION PROCEDURE; CRYSTALLINITY; DEPOSITION PRECIPITATION METHOD; MIXED OXIDES; STRUCTURAL CHARACTERIZATION;

CERIUM COMPOUNDS;

EID: 0242306838     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0358376     Document Type: Article

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