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Volumn 56, Issue 4, 2000, Pages 403-413
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XPS and SIMS characterization
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Author keywords
Characterization; Oxide catalysts; SIMS; XPS
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Indexed keywords
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EID: 0034643168
PISSN: 09205861
EISSN: None
Source Type: Journal
DOI: 10.1016/S0920-5861(99)00300-4 Document Type: Article |
Times cited : (90)
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References (10)
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