SCOPUS 정보 검색 플랫폼

Surface Science

Volumn 498, Issue 3, 2002, Pages 266-274

An XPS study of the growth and electronic structure of vanadia films supported on CeO2(1 1 1)

(2) Wong, G S a Vohs, J M a

a UNIVERSITY OF PENNSYLVANIA (United States)

Author keywords

Cerium; Vanadium oxide; X ray photoelectron spectroscopy

Indexed keywords

ATOMS; CERIUM COMPOUNDS; DESORPTION; ELECTRONIC STRUCTURE; FILM GROWTH; MONOLAYERS; MULTILAYERS; OXIDATION; STOICHIOMETRY; TEMPERATURE PROGRAMMED DESORPTION; THERMAL EFFECTS; VANADIUM COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

OXIDATION TREATMENTS; VANADIA;

METALLIC FILMS;

EID: 0037138552 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(01)01761-7 Document Type: Article

Times cited : (61)

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