Structural characterization of CeO2-TiO2 and V2O5/CeO2-TiO2 catalysts by Raman and XPS techniques

Journal of Physical Chemistry B

Volumn 107, Issue 22, 2003, Pages 5162-5167

  Reddy, Benjaram M ^a   Khan, Ataullah ^a   Yamada, Yusuke ^b   Kobayashi, Tetsuhiko ^b   Loridant, Stéphane ^c   Volta, Jean Claude ^c  

^a INDIAN INSTITUTE OF CHEMICAL TECHNOLOGY   (India)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^c CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; CALCINATION; CERIUM COMPOUNDS; CRYSTALLIZATION; ELECTRONS; HIGH TEMPERATURE EFFECTS; IMPREGNATION; OXIDATION; RAMAN SPECTROSCOPY; TITANIUM DIOXIDE; X RAY PHOTOELECTRON SPECTROSCOPY; X RAY POWDER DIFFRACTION;

OXIDATION STATES;

CATALYSTS;

EID: 0038172241     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0344601     Document Type: Article

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