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Volumn 48, Issue 1, 2004, Pages 103-109

Modeling and parameter extraction procedure for nanocrystalline TFTs

Author keywords

Microcrystalline; Nanocrystalline; Parameter extraction; TFT modeling

Indexed keywords

PARAMETER ESTIMATION; POLYSILICON; THIN FILM TRANSISTORS; TRANSCONDUCTANCE;

EID: 0142247332     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(03)00267-3     Document Type: Article
Times cited : (25)

References (7)
  • 1
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    • 0035390039 scopus 로고    scopus 로고
    • New Procedure for the extraction of basic a-Si:H TFT model parameters in the linear and saturation regions
    • Cerdeira A., Estrada M., García R., Ortiz-Conde A., García Sanchez F.J. New Procedure for the extraction of basic a-Si:H TFT model parameters in the linear and saturation regions. Solid-State Electron. 45:2001;1077.
    • (2001) Solid-state Electron. , vol.45 , pp. 1077
    • Cerdeira, A.1    Estrada, M.2    García, R.3    Ortiz-Conde, A.4    García Sanchez, F.J.5
  • 4
    • 17744407765 scopus 로고    scopus 로고
    • New procedure for the extraction of a-Si:H TFTs model parameters in the subthreshold region
    • Reséndiz L., Estrada M., Cerdeira A. New procedure for the extraction of a-Si:H TFTs model parameters in the subthreshold region. Solid-State Electron. 47(8):2003;1351.
    • (2003) Solid-state Electron. , vol.47 , Issue.8 , pp. 1351
    • Reséndiz, L.1    Estrada, M.2    Cerdeira, A.3
  • 6
    • 0021427789 scopus 로고
    • Physics of amorphous silicon based alloy field-effect transistors
    • Shur M., Hack M. Physics of amorphous silicon based alloy field-effect transistors. J. Appl. Phys. 55:1984;3831.
    • (1984) J. Appl. Phys. , vol.55 , pp. 3831
    • Shur, M.1    Hack, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.