Instruction Based BIST for Board/System Level Test of External Memories and Interconnects

IEEE International Test Conference (TC)

Volumn , Issue , 2003, Pages 961-970

  Caty, Olivier ^a   Bayraktaroglu, Ismet ^a   Majumdar, Amitava ^a   Lee, Richard ^b   Bell, John ^a   Curhan, Lisa ^a  

^a SUN MICROSYSTEMS   (United States)

^b MICROSOFT   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; BUFFER STORAGE; BUILT-IN SELF TEST; MICROPROCESSOR CHIPS; NETWORK PROTOCOLS;

MEMORY INTERCONNECTS;

DATA STORAGE EQUIPMENT;

EID: 0142246872     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

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