BIST vs. ATE: Need a different vehicle?

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 1148-

  Sunter, Stephen ^a  

^a LogicVision Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; AUTOMATIC TESTING; BUILT-IN SELF TEST; EMBEDDED SYSTEMS; RESPONSE TIME (COMPUTER SYSTEMS); TIMING CIRCUITS;

AUTOMATED TEST EQUIPMENT (ATE);

INTEGRATED CIRCUIT TESTING;

EID: 0032311594     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)