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Volumn 82, Issue 8, 1997, Pages 3652-3660
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Oscillation of the cantilever in atomic force microscopy: Probing the sample response at the microsecond scale
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001613550
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.365727 Document Type: Article |
Times cited : (7)
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References (23)
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