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Volumn 82, Issue 8, 1997, Pages 3652-3660

Oscillation of the cantilever in atomic force microscopy: Probing the sample response at the microsecond scale

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001613550     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365727     Document Type: Article
Times cited : (7)

References (23)
  • 6
  • 10
    • 85033171871 scopus 로고    scopus 로고
    • thèse Université Bordeaux I
    • S. Gauthier, thèse Université Bordeaux I, 1996.
    • (1996)
    • Gauthier, S.1
  • 11
    • 85033169448 scopus 로고    scopus 로고
    • Digital Instrument, Santa Barabara, CA
    • Digital Instrument, Santa Barabara, CA.
  • 12
    • 85033179096 scopus 로고    scopus 로고
    • See for instance, the AFM cantilevers (Nanoprobes)
    • See for instance, the AFM cantilevers (Nanoprobes).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.