XPS studies of chemically etched surfaces of (La,Sr)(Al,Ta)O3 single crystals

Journal of Alloys and Compounds

Volumn 361, Issue 1-2, 2003, Pages 282-288

  Talik, E ^a   Kruczek, M ^a   Sakowska, H ^b   Szyrski, W ^b  

^a UNIVERSITY OF SILESIA   (Poland)

^b Research Group of Integrated Circuits and System Design   (Poland)

Author keywords

Electronic state; Oxide materials; Photoelectron spectroscopy; Rare earth compounds; Surfaces

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; BINDING ENERGY; COMPOSITION; ELECTRONIC STRUCTURE; ETCHING; LANTHANUM COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

DEFECT STATES;

SINGLE CRYSTALS;

EID: 0141991782     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-8388(03)00424-9     Document Type: Article

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