Infrared spectroscopic study of the morphology of 3,4,9,10-perylene tetracarboxylic dianhydride films grown on H-passivated Si(111)

Journal of Physics Condensed Matter

Volumn 15, Issue 38, 2003, Pages

  Scholz, Reinhard ^a   Friedrich, Marion ^a   Salvan, Georgeta ^a   Kampen, Thorsten U ^a   Zahn, Dietrich R T ^a   Frauenheim, Thomas ^b  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

^b UNIVERSITY OF PADERBORN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AROMATIC COMPOUNDS; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; FILM GROWTH; INFRARED SPECTROSCOPY; LASER ABLATION; MORPHOLOGY; PASSIVATION; PROBABILITY DENSITY FUNCTION; SEMICONDUCTING SILICON; SUBSTRATES; SURFACES;

ORGANIC MOLECULAR BEA DEPOSITION; PERYLENE TETRACARBOXYLIC DIANHYDRIDE; SINGLE MOLECULE;

SEMICONDUCTING FILMS;

EID: 0141982917     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/15/38/005     Document Type: Article

References (37)

1. Forrest S R 1997 Chem. Rev. 97 1793
2. Nelson S F, Gundlach D J and Jackson T N 1998 Appl. Phys. Lett. 72 1854
3. Tung W and van Slyke S A 1987 Appl. Phys. Lett. 51 913
4. Burrows P E and Forrest S R 1993 Appl. Phys. Lett. 62 3102
5. Taylor R T, Burrows P E and Forrest S R 1997 IEEE Photon. Technol. Lett. 9 365
6. Kendrick C and Kahn A 1998 Appl. Surf. Sci. 123/124 405
7. Umbach E, Sokolowski M and Fink R 1996 Appl. Phys. A 63 565
8. Fuchigami H, Tanimura S, Uehara Y, Kurata T and Tsunoda S 1995 Japan. J. Appl. Phys. 34 3852
9. Antunes P A, Constantino C J L and Aroca R 2001 Appl. Spectrosc. 55 1341
10. Akers K, Aroca R, Hor A and Loutfy R O 1987 J. Phys. Chem. 91 2954
11. Böhringer M, Schneider W-D, Glöcker K, Umbach E and Berndt R 1998 Surf. Sci. 419 L95
12. Chizhov I, Kahn A and Scoles G 2000 J. Cryst. Growth 208 449
13. Murakami M, Iijima S and Yoshimura S 1986 J. Appl. Phys. 60 3856
14. Kamo H, Yudakasa M, Kurita S, Matsui T, Kikushi R, Ohki Y and Yoshimura S 1994 Synth. Met. 68 61
15. Uder B, Ludwig C, Petersen J, Grompf B and Eisenmebger W 1995 Z. Phys. B 97 389
16. Morozov A O, Kampen T U and Zahn D R T 2000 Surf. Sci. 446 193
17. Kampen T U, Tenne D A, Park S, Salvan G, Scholz R and Zahn D R T 1999 Phys. Status Solidi b 215 431
18. Yudasaka M, Tasaka Y, Tanaka M, Kamo H, Ohki Y, Usami S and Yoshimura S 1994 Appl. Phys. Lett. 64 3237
19. Nishio S, Mase R, Oba T, Matsuzaki A and Sato H 1998 Appl. Surf. Sci. 127-129 589
20. Friedrich M, Wagner T, Salvan G, Park S, Kampen T U and Zahn D R T 2002 Appl. Phys. A 75 501
21. Kaiser R, Friedrich M, Schmitz-Hübsch T, Sellam F, Hohenecker S, Kampen T U, Leo K and Zahn D R T 1999 Fresenius J. Anal. Chem. 363 189
22. Mead D G and Lowry S R 1980 Appl. Spectrosc. 34 167
23. Lovinger A J, Forrest S R, Kaplan M L, Schmidt P H and Venkatesan T 1984 J. Appl. Phys. 55 476
24. Vragović I, Scholz R and Schreiber M 2002 Europhys. Lett. 57 288
25. Zang D Y, So F F and Forrest S R 1991 Appl. Phys. Lett. 59 823
26. Harbecke B, Heinz B, Offermann V and Theiß W 1996 Far-infrared spectroscopy Optical Characterization of Epitaxial Semiconductor Layers ed G Bauer and W Richter (Berlin: Springer) p 203
27. Collins R J and Fan H Y 1954 Phys. Rev. 93 674
28. Johnson F A 1959 Proc. Phys. Soc. 73 265
29. van de Hulst H C 1981 Light Scattering by Small Particles (New York: Dover) ch 14.22
30. van de Hulst H C 1981 Light Scattering by Small Particles (New York: Dover) ch 11.22
31. Scholz R, Kobitski A Yu, Kampen T U, Schreiber M, Zahn D R T, Jungnickel G, Elstner M, Sternberg M and Frauenheim T 2000 Phys. Rev. B 61 13659
32. Elstner M, Porezag D, Jungnickel G, Elsner J, Haugk M, Frauenheim T, Suhai S and Seifert G 1998 Phys. Rev. B 58 7260
33. Becke A D 1988 Phys. Rev. A 38 3098
34. Lee C, Yang W and Parr R G 1988 Phys. Rev. A 37 785
35. Kobitiski A Yu, Scholz R and Zahn D R T 2003 J. Mol. Struct.: Theochem 625 39
36. Tautz F S, Sloboshanin S, Schaefer J A, Scholz R, Shklover V, Sokolowski M and Umbach E 2000 Phys. Rev. B 61 16933
37. Ogawa T, Kuwamoto K, Isoda S, Kobayashi T and Karl N 1999 Acta Crystallogr. B 55 123