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Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

Scanning force microscopy on heavy-ion tracks in muscovite mica: Track diameter versus energy loss and loading force

(4) Ackermann, J a Muller A a Neumann, R a Wang, Y a,b

a GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH (Germany)

b PEKING UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

DATA SETS; ENERGY LOSS; FRESHLY CLEAVED MICA; HEAVY ION IRRADIATION; HEAVY-ION TRACKS; IMAGING PROCESS; ION ENERGY LOSS; ION TRACK; LATENT ION TRACKS; LATERAL FORCE MICROSCOPY; LINEAR RELATION; LOADING FORCE; MUSCOVITE MICA; SCANNING FORCE MICROSCOPY; STATISTICAL DISTRIBUTION; TRACK DIAMETER;

ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISSIPATION; HEAVY IONS; NANOELECTRONICS; SCANNING TUNNELING MICROSCOPY; SELENIUM; SILICATE MINERALS; ZINC;

MICA;

EID: 0141908410 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s003390051316 Document Type: Article

Times cited : (10)

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