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Volumn 53, Issue 24, 1996, Pages R16180-R16183
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Load-dependent topographic and friction studies of individual ion tracks in layered materials by scanning force microscopy and lateral force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0011894891
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.53.R16180 Document Type: Article |
Times cited : (4)
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References (12)
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