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Volumn 53, Issue 24, 1996, Pages R16180-R16183

Load-dependent topographic and friction studies of individual ion tracks in layered materials by scanning force microscopy and lateral force microscopy

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EID: 0011894891     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.53.R16180     Document Type: Article
Times cited : (4)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.