Ion tracks in mica studied with scanning force microscopy using force modulation

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 116, Issue 1-4, 1996, Pages 492-495

  Neumann, R ^a   Ackermann, J ^a   Angert, N ^a   Trautmann, C ^a   Dischner, M ^b   Hagen, T ^b   Sedlacek, M ^b  

^a GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

^b UNIVERSITY OF HEIDELBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHIZATION; CRYSTALLINE MATERIALS; ELASTICITY; FRICTION; IONS; MICROSCOPIC EXAMINATION; SIGNAL DETECTION; SURFACE PROPERTIES;

FORCE MODULATION; ION TRACKS; SCANNING FORCE MICROSCOPY; SELECTIVE TRACK ETCHING; TRACK CROSS SECTIONS;

CRYSTAL DEFECTS;

EID: 0030218251     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(96)00095-X     Document Type: Article

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