Latent (sub-surface) tracks in mica studied by tapping mode scanning force microscopy

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 111, Issue 1-2, 1996, Pages 87-90

  Daya, D D N Barlo ^a   Reimann, C T ^b   Hallen A ^b   Sundqvist, B U R ^b   Hakansson P ^b  

^a UNIVERSITY OF COLOMBO   (Sri Lanka)

^b UPPSALA UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ION BOMBARDMENT; IONS; MATHEMATICAL MODELS; PARTICLE BEAM TRACKING; SURFACE STRUCTURE; SURFACES;

CLEAVING; HILLOCKS; INCIDENT ANGLE; ION TRACKS; LATENT TRACKS; MUSCOVITE; SCANNING FORCE MICROSCOPY;

MICA;

EID: 0030121071     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583x(95)01285-0     Document Type: Article

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