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Journal of Applied Physics

Volumn 87, Issue 9, 2000, Pages 5191-5193

Temperature stability of [formula omitted] junctions

(6) Schmalhorst, J a Bruckl H a Reiss, G a Vieth, M b Gieres, G b Wecker, J b

a BIELEFELD UNIVERSITY (Germany)

b SIEMENS AG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000267112 PISSN: 00218979 EISSN: 10897550 Source Type: Journal
DOI: 10.1063/1.373291 Document Type: Conference Paper

Times cited : (31)

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