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Volumn 5038 I, Issue , 2003, Pages 493-495
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Making carbon nanotube probes for high aspect ratio scanning probe metrology
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CARBON NANOTUBES;
ION BEAM ASSISTED DEPOSITION;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
SCANNING;
CATALYST FILMS;
FOCUS ION BEAM PATTERNING;
HIGH ASPECT RATIO CRITICAL DIMENSIONING METROLOGY;
PROBES;
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EID: 0141723655
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.483759 Document Type: Conference Paper |
Times cited : (5)
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References (8)
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