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Volumn 5038 I, Issue , 2003, Pages 493-495

Making carbon nanotube probes for high aspect ratio scanning probe metrology

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; ION BEAM ASSISTED DEPOSITION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SCANNING;

EID: 0141723655     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.483759     Document Type: Conference Paper
Times cited : (5)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.