SCOPUS 정보 검색 플랫폼

Volumn 16, Issue 11, 2001, Pages 3246-3253

Growth and characterization of aligned carbon nanotubes from patterned nickel nanodots and uniform thin films

(11) Wen, J G a Huang, Z P a Wang, D Z a Chen, J H a Yang, S X a Ren, Z F a Wang, J H b Calvet, L E c Chen, J c Klemic, J F c Reed, M A c

a BOSTON COLLEGE (United States)

b UNIVERSITY AT BUFFALO (United States)

c YALE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTRON MICROSCOPY; GROWTH (MATERIALS); MICROSTRUCTURE; NICKEL; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SUBSTRATES; THIN FILMS;

SINGLE-WALL CARBON NANOTUBES (SWNT);

CARBON NANOTUBES;

EID: 0035522064 PISSN: 08842914 EISSN: None Source Type: Journal
DOI: 10.1557/JMR.2001.0447 Document Type: Article

Times cited : (69)

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