Effects of stress on electron emission from nanostructured carbon materials

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 21, Issue 4, 2003, Pages 1710-1714

  Poa, C H P ^a   Lacerda, R G ^a,b   Cox, D C ^a   Marques, F C ^b   Silva, S R P ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

^b UNIVERSITY OF CAMPINAS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; BAND STRUCTURE; CARBON; CHEMICAL BONDS; COMPRESSIVE STRESS; ELECTRON EMISSION; ELECTRONIC DENSITY OF STATES; FERMI LEVEL; ION BEAM ASSISTED DEPOSITION; SURFACE PROPERTIES; THRESHOLD VOLTAGE; X RAY PHOTOELECTRON SPECTROSCOPY;

HYBRIDIZATION;

NANOSTRUCTURED MATERIALS;

EID: 0141458086     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1591747     Document Type: Conference Paper

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