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Volumn 42, Issue 7 B, 2003, Pages 4659-4662
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Si(111)-√21 × √21-(Ag+Cs) surface studied by scanning tunneling microscopy and angle-resolved photoemission spectroscopy
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Author keywords
Angle resolved photoemission spectroscopy; Scanning tunneling microscopy; Si(111); Surface superstructure
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Indexed keywords
ATOMS;
CESIUM;
ELECTRIC CONDUCTIVITY;
ELECTRONIC STRUCTURE;
FERMI LEVEL;
PHOTOEMISSION;
SCANNING TUNNELING MICROSCOPY;
SUBSTRATES;
SURFACE STRUCTURE;
ULTRAHIGH VACUUM;
ANGLE RESOLVED PHOTOEMISSION SPECTROSCOPY;
ATOMIC ARRANGEMENT;
SURFACE STATE BAND;
SURFACE SUPERSTRUCTURE;
SEMICONDUCTING SILICON;
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EID: 0141457693
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.42.4659 Document Type: Article |
Times cited : (10)
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References (15)
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