Wide band gap semiconductor reliability: Status and trends

Microelectronics Reliability

Volumn 43, Issue 9-11, 2003, Pages 1705-1712

  Delage, S L ^a   Dua, C ^a  

^a THALES RESEARCH AND TECHNOLOGY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH ELECTRON MOBILITY TRANSISTORS; LIGHT EMITTING DIODES; MICROWAVE AMPLIFIERS;

BAND GAP SEMICONDUCTORS;

SEMICONDUCTOR MATERIALS;

EID: 0043195441     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(03)00338-X     Document Type: Conference Paper

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