Room-temperature electrical conductivity studies of sulfur-modified microcrystalline diamond thin films

Applied Physics Letters

Volumn 83, Issue 3, 2003, Pages 491-493

  Gupta, S ^a   Weiner, B R ^b   Morell, G ^b  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b UNIVERSITY OF PUERTO RICO   (Puerto Rico)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIAMOND FILMS; ELECTRIC CONDUCTIVITY; GRAIN BOUNDARIES; IONIZATION; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON; SUBSTRATES; SULFUR;

DIAMOND THIN FILMS;

THIN FILMS;

EID: 0043128614     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1591065     Document Type: Article

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