Studies on single-event phenomena using the heavy-ion microbeam at JAERI

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 210, Issue , 2003, Pages 227-231

  Hirao, Toshio ^a   Mori, Hidenobu ^b   Laird, Jamie Stuart ^a   Onoda, Shinobu ^b   Wakasa, Takeshi ^b   Abe, Hiroshi ^a   Itoh, Hisayoshi ^a  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

^b TOKAI UNIVERSITY   (Japan)

Author keywords

Collected charge; MBU; Microbeam; Single event upset; TCAD; TIBIC

Indexed keywords

DIFFUSION IN SOLIDS; ELECTRIC CHARGE; ELECTRIC CURRENTS; HEAVY IONS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DIODES; SILICON ON INSULATOR TECHNOLOGY;

COLLECTED CHARGE; FUNNELING;

SEMICONDUCTING SILICON;

EID: 0043014906     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(03)01013-9     Document Type: Conference Paper

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