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Volumn 130, Issue 1-4, 1997, Pages 498-502
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Recent progress in JAERI single ion hit system
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Author keywords
[No Author keywords available]
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Indexed keywords
MICROSCOPIC EXAMINATION;
PARTICLE BEAM INJECTION;
PARTICLE DETECTORS;
SEMICONDUCTOR DEVICES;
ION MICROBEAMS;
ION BEAMS;
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EID: 0031548966
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(97)00240-1 Document Type: Article |
Times cited : (18)
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References (10)
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