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Volumn 130, Issue 1-4, 1997, Pages 498-502

Recent progress in JAERI single ion hit system

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPIC EXAMINATION; PARTICLE BEAM INJECTION; PARTICLE DETECTORS; SEMICONDUCTOR DEVICES;

EID: 0031548966     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00240-1     Document Type: Article
Times cited : (18)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.